Applied Measurement with jMetrik

J. Patrick Meyer (University of Virginia, USA)

$326

Hardback

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English

Routledge
27 June 2014

Philosophy & theory of education; Examinations & assessment; Higher & further education, tertiary education; Teaching skills & techniques

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

By: J. Patrick Meyer (University of Virginia USA)
Imprint: Routledge
Country of Publication: United Kingdom
Dimensions: Height: 229mm, Width: 152mm, Spine: 15mm
Weight: 362g
ISBN: 9780415531955
ISBN 10: 0415531950
Pages: 170
Publication Date: 27 June 2014
Audience: College/higher education , General/trade , Primary , ELT Advanced
Format: Hardback
Publisher's Status: Active

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia