Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

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Ruijing Shen Sheldon X.-D. Tan

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Ruijing Shen, Sheldon X.-D. Tan, Hao Yu

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English

Springer-Verlag New York Inc.
18 March 2012

Precision instruments manufacture; Circuits & components; Computer-aided design (CAD)

Summary
Details

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits.

Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.

Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in thecontext of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.

By: Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
Imprint: Springer-Verlag New York Inc.
Country of Publication: United States
Edition: 2012
Dimensions: Height: 235mm, Width: 155mm, Spine: 19mm
Weight: 670g
ISBN: 9781461407874
ISBN 10: 1461407877
Pages: 306
Publication Date: 18 March 2012
Audience: Professional and scholarly , Undergraduate
Format: Hardback
Publisher's Status: Active